au.\*:("WAKIMOTO, O")
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Monitor Technology of Outer Circumstances for Mask EB Writing SystemHOSHI, H; SAMOTO, N; MANABE, H et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7748, issn 0277-786X, isbn 0-8194-8238-2 978-0-8194-8238-9, 1Vol, 774817.1-774817.8Conference Paper
Monitor and self-diagnostic technology for mask e-beam writing system (2)SAMOTO, N; MANABE, H; WAKIMOTO, O et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7637, issn 0277-786X, isbn 978-0-8194-8051-4 0-8194-8051-7, 76371K.1-76371K.8Conference Paper